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PROBE NEEDLES FOR WAFER AND HYBRID TEST APPLICATIONS FROM ATEK TECHNOLOGY

Press contact : Lesley Ashburner

Date : 14 February, 2003


Designed for use in wafer and hybrid test applications, the ATEK Technology range of probe needles offers high electrical conductivity and flexural strength as well as corrosion and wear resistance.

Featuring a nickel plated finish, they are made from tungsten or tungsten-rhenium to provide the required hardness for a precise contact, onto aluminium pads are used. Even after many cycles, these rugged, reliable needles exhibit minimum tip wear and offer a longer service life. In addition they afford greater penetration into the oxide coating of aluminium pads during contacting.

The ATEK range comprises needle diameters from 7 to 14mm in lengths from 1250 to 2000mm, with taper lengths and round tip diameters from 80 to 150mm and 1.0 to 8.0mm. Tip drops are available from 7 to 220mm and tip angles from 61 to 83. Straight needles, flat tips and other materials, including BeCu and Trivar, can also be supplied.

With over 30 years experience in the supply of high quality test products, ATEK Technology offers probe selection advice as well as a probe sourcing service. Further information is available from Peter Ashburner, ATEK Technology Limited, Technology House, Stewley, Ilminster, TA19 9YU. Tel: 01823 481248, Fax: 01823 481120